Qnano :: Equipment

Equipment

Ellipsometer $SOPRA GES 5E spectroscopic ellipsometer measures thickness and refractive index of mesoporous thin films supported on different substrates. Spectral range of this equipment lies in the 190 to 900 nm and has a special chamber for humidity control in order to perform porosimetry from water adsorption-desorption isotherms.$

Nanoindenter Agilent G200

Thin Films preparation

Spray Dryer

X-ray Diffractometer $PANanalytical Empyrean Diffractometer is an X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects. The equipment offers the possibility to perform phase identification and quantitative analysis, reflectometry, grazing angle diffraction, analysis of the effects of stress and crystallite size determination. PreFix philosophy hardware components can be easily exchanged without laborious re-alignment procedures.$