Structural Characterization

In order to assess the properties of the complex materials prepared in the group, the use of complementary techniques of characterization is required.

We use spectroscopy (UV, fluorescence, FTIR, Raman), electronic microscopy (TEM and SEM) and techniques of dispersion (dynamic scattering of light, small angle X-Ray scattering and X-ray diffraction) routinely. In addition, we develop characterization methods specially adapted for these materials: functional groups determination (XPS, DRIFTS); crystallization studies (XANES); analysis film porosity, and its evolution under different environments (ellipsoporosimetry and X-Ray reflectivity) and study of mechanical properties of porous coatings (nanoindentation and ellipsoporosimetry).